Prototype test insertion co-processor for agile development in multi-threaded embedded environments

Abstract

Agile methodologies have been shown useful in constructing Enterprise applications with a reduced level of defects in the released product. Movement of Agile processes into the embedded world is hindered by the lack of suitable tool support. For example, software instrumented test insertion methods to detect race condition in multithreaded programs have the potential to increase code size beyond the limited embedded system memory, and degrade performance to an extent that would impair the real-time characteristics of the system. We propose a FPGA-based, hardware assisted, test insertion co-processor for embedded systems which introduces low additional system overhead and incurs minimal code size increase. In this preliminary study, we compare the ideal characteristics of a FPGA-based test insertion co-processor with our initial prototype and other proposed hardware assisted test insertion approaches.