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dc.contributor.authorSchwarz, M.H.en
dc.contributor.authorBorcsok, J.en
dc.contributor.editor-en
dc.date.accessioned2017-03-21T13:26:17Z
dc.date.available2017-03-21T13:26:17Z
dc.date.copyright2013
dc.date.issued2013-06
dc.identifier.citationSchwarz, M.H. and Borcsok, J. (2013) 'Reliable system design with a high degree of diagnostic procedures for embedded systems', presented at 24th IET Irish Signals and Systems Conference (ISSC 2013), Jun 20 - 21.en
dc.identifier.isbn978-1-84919-754-0en
dc.identifier.issn-en
dc.identifier.urihttps://research.thea.ie/handle/20.500.12065/1040
dc.description.abstractMaintenance starts with reliable diagnostics. Programming Logic Controllers (PLCs) are often equipped with a high degree of diagnostic procedures in order to ensure that the processing unit is functioning correctly. It is vital to verify that the system with its programme is still within a 'healthy' state, otherwise a safety function is called and the system is brought into a safe state, or if possible, defect and malfunctioning components are exchanged during operation and the process can continue without shutting down the system. However, when it comes to smaller devices such as intelligent sensors, embedded controller devices with the functionality of an e.g. PID (Proportional-Integral-Derivative), predictive controller, filter or analytical algorithm, which is embedded into a FPGA or micro-controller then diagnostics and verification methods are often not considered in the way they should be. For example, if an intelligent sensor system is not able to diagnose that the sensor-head is malfunctioning, but the sensor-head still provides some data, then the smart algorithm bases its calculation on wrong data, which can cause a dangerous situation. This paper investigates and shows recent results to combine diagnostic methods for small scale devices. Several safety-related structures are considered with a high degree of diagnostic coverage. The paper presents relevant procedures and structures to increase the reliability of small devices without utilising a full scale microcontroller system.en
dc.formatPdfen
dc.language.isoenen
dc.publisherSignals and Systems Conference (ISSC 2013), 24th IET Irishen
dc.subjectReliabilityen
dc.subjectDiagnosisen
dc.subjectMaintenanceen
dc.subjectSafety structureen
dc.titleReliable system design with a high degree of diagnostic procedures for embedded systemsen
dc.typeConference Presentationen
dc.description.peerreviewYesen
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6621234&punumber%3D6606941%26sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6620810%29%26pageNumber%3D2en
dc.subject.departmentScienceen


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